Maximum-information photoelectron metrology

Maximum-information photoelectron metrology

Two new articles, on quantum metrology via polarization-shaped pulses (mostly theory) and maximum-information photoelectron metrology via tomographic measurements (mostly experiment), have just been published in PRA.

Complete photoionization experiments via ultrafast coherent control with polarization multiplexing. II. Numerics and analysis methodologies

P. Hockett, M. Wollenhaupt, C. Lux, and T. Baumert

Phys. Rev. A 92, 013411 – Published 13 July 2015

(also available at arXiv:1503.08247 (2015))

 

Maximum-information photoelectron metrology

P. Hockett, C. Lux, M. Wollenhaupt, and T. Baumert

Phys. Rev. A 92, 013412 – Published 13 July 2015

(also available at arXiv:1503.08308 (2015))

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