Quantum Metrology with Photoelectrons (book)

Quantum Metrology with Photoelectrons (book)

Update April 2018 – the books are now available via IOP, see details at end of post.

Book for IOP Concise Physics series, due early 2018

Dr. Paul Hockett

National Research Council of Canada

Online resources

OSF project (ID: q2v3g) with interactive content and additional resources, DOI: 10.17605/OSF.IO/Q2V3G

femtolab.ca website, posts tagged “metrology-book”

femtolab.ca website, posts tagged “video”


Photoionization is an interferometric process, in which multiple paths can contribute to the final continuum photoelectron wavefunction. At the simplest level, interferences between different final angular momentum states are manifest in the energy and angle resolved photoelectron spectra: metrology schemes making use of these interferograms are thus phase-sensitive, and provide a powerful route to detailed understanding of photoionization. In these cases, the continuum wavefunction (and underlying scattering dynamics) can be characterised. At a more complex level, such measurements can also provide a powerful probe for other processes of interest, leading to a more general class of quantum metrology built on phase-sensitive photoelectron imaging.  Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology.

Volume I covers the core physics of photoionization, including a range of computational examples. The material is presented as both reference and tutorial, and should appeal to readers of all levels.  Volume II explores applications, and the development of quantum metrology schemes based on photoelectron measurements. The material is more technical, and will appeal more to the specialist reader.

Full text

Quantum Metrology with Photoelectrons

Volume 1
ISBN 978-1-6817-4684-5
Volume 2
ISBN 978-1-6817-4688-3


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