Quantum Metrology with Photoelectrons (book)

Quantum Metrology with Photoelectrons (book)

Book for IOP Concise Physics series, due early 2018

Dr. Paul Hockett

National Research Council of Canada

Online resources

OSF project (ID: q2v3g) with interactive content and additional resources

femtolab.ca website, posts tagged “metrology-book”

femtolab.ca website, posts tagged “video”

Abstract

Photoionization is an interferometric process, in which multiple paths can contribute to the final continuum photoelectron wavefunction. At the simplest level, interferences between different final angular momentum states are manifest in the energy and angle resolved photoelectron spectra: metrology schemes making use of these interferograms are thus phase-sensitive, and provide a powerful route to detailed understanding of photoionization. In these cases, the continuum wavefunction (and underlying scattering dynamics) can be characterised. At a more complex level, such measurements can also provide a powerful probe for other processes of interest, leading to a more general class of quantum metrology built on phase-sensitive photoelectron imaging.  Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology: this book aims to discuss the fundamental concepts along with recent and emerging applications.